The LS 13 320 XR laser diffraction particle sizing analyzer offers best-in-class particle size distribution data from advanced PIDS technology, which enables high-resolution measurements and an expanded dynamic range. Like the LS 13 320, the XR particle size analyzer provides fast, accurate results, and helps you streamline workflows to optimize efficiency. Some big improvements help you reliably spot small differences that can have a huge impact on your particle analysis data.
- Direct measurement range from 10 nm – 3500 µm
- Automatically highlights pass/fail results for faster quality control
- Enhanced software that simplifies method creation for standardized measurements
- New control standards to adequately verify instrument/module performance

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Technical information

Technology:
Low-angle forward light scattering with additional PIDS (Polarization Intensity Differential Scattering) Technology. Analysis of vertical and horizontal polarized light at six different angles using three additional wavelengths. Full implementation of both Fraunhofer and Mie Theories.

Light source:
- Diffraction: Laser diode (785 nm)
- PIDS: Tungsten lamp with high-quality band-pass filters (475, 613 and 900 nm)

Particle size analysis range:
- Measurement range: 10 nm – 3500 µm
- Dry Powder System Module (DPS): 400 nm - 3500 µm
- Universal Liquid Module (ULM): 10 nm - 2000 µm

Compliance: Creates 21 CFR Part 11 enabling features RoHS
Certifcations:
- EU EMC Directive 2014/30/EU
- CISPR 11:2009/A1:2010
- Australia and New Zealand RCM Mark

Data export file formats: XLSX, TSV, PDF

Software operating system: Requires Microsoft Windows 10, 64-bit environment (U.S. English regional settings only).